| 摘要 |
PROBLEM TO BE SOLVED: To provide a method capable of reducing the time required for the fuse element program, and thus suppressing an increase in system LSI inspection cost. SOLUTION: A fuse element 31 is connected in series to a program transistor 32, a flip-flop 23, in response to a start signal, turns on the program transistor 32 so that the program of the fuse element 31 can start and a 2-input NAND circuit 35 monitors a change in the resistance value of the fuse element 31, by checking voltage variation at the contact of the fuse element 31 and program transistor 32 to output an end signal, at the timing when the resistance value of the fuse element 31 reaches a predetermined resistance value. A flip-flop 23, in response to the end signal, turns off the program transistor 32 to automatically terminate the program of the fuse element 31. In this way, the resistance value of the fuse element 31 increases up to a predetermined value with a minimum programing time. COPYRIGHT: (C)2006,JPO&NCIPI
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