发明名称 |
TRANSMISSION TYPE ELECTRON MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a high-resolution image in a transmission type electron microscope having a CCD camera. SOLUTION: The transmission type electron microscope comprises an irradiation optical system for irradiating a sample with electron beams; an imaging apparatus having a CCD for capturing the transmission image of the sample; a transmission image moving device for moving a transmission image; and an image composition part for generating one image by compositing a plurality of images. The image composition part generates the same image as an image obtained by assuming that a light reception section is arranged at the non-light-reception section of the CCD by compositing the image obtained from the transmission image and an image obtained by moving the transmission image. COPYRIGHT: (C)2006,JPO&NCIPI
|
申请公布号 |
JP2006114348(A) |
申请公布日期 |
2006.04.27 |
申请号 |
JP20040300667 |
申请日期 |
2004.10.14 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
NAGAOKI ISAO;YOTSUTSUJI TAKAFUMI |
分类号 |
H01J37/22 |
主分类号 |
H01J37/22 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|