发明名称 Bumping process and structure thereof
摘要 A bumping process includes the steps of: firstly, providing a wafer; forming a first photo-resist layer on a active surface of the wafer and forming at least a first opening on the first photo-resist layer; next, forming a first copper pillar in the first opening; next, forming a second photo-resist layer on the first photo-resist layer and forming at least a second opening on the second photo-resist layer, wherein the second opening smaller than the first opening so that a portion of the surface of the first copper pillar is exposed in the second opening; then, forming a second copper pillar in the second opening; finally, forming a solder layer on the second copper pillar; and removing the first and second photo-resist layers.
申请公布号 US2006087034(A1) 申请公布日期 2006.04.27
申请号 US20050236196 申请日期 2005.09.27
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 HUANG MIN-LUNG;CHEN YI-HSIN;CHEN JIA-BIN
分类号 H01L23/48;H01L21/44;H01L21/60;H01L23/485 主分类号 H01L23/48
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