发明名称 Struktur und Herstellung von Leistungs-MOSFET unter Einbeziehung der Struktur des Randes
摘要 A power MOSFET is created from a semiconductor body (2000 and 2001) having a main active area and a peripheral termination area. A first insulating layer (2002) of substantially uniform thickness lies over the active and termination areas. A main polycrystalline portion (2003A/2003B) lies over the first insulating layer largely above the active area. First and second peripheral polycrystalline segments (2003C1 and 2003C2) lie over the first insulating layer above the termination area. A gate electrode (2016) contacts the main polycrystalline portion. A source electrode (2015A/2015B) contacts the active area, the termination area, and the first polycrystalline segment. An optional additional metal portion (2019) contacts the second polycrystalline segment. The MOSFET is typically created by a five-mask process. A defreckle etch is performed subsequent to metal deposition and patterning to define the two peripheral polycrystalline segments. <IMAGE>
申请公布号 DE69434643(D1) 申请公布日期 2006.04.27
申请号 DE1994634643 申请日期 1994.07.22
申请人 SILICONIX INC., SANTA CLARA 发明人 HSHIEH, FWU-IUAN;CHANG, MIKE;CHEN, JUN WEI;OWYANG, KING;PITZER, DORMAN C.;VAN DER LINDE, JAN
分类号 H01L29/06;H01L21/28;H01L21/316;H01L21/322;H01L21/336;H01L29/10;H01L29/40;H01L29/772;H01L29/78 主分类号 H01L29/06
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