| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for enabling measurement of light emission by photoexcitation and light emission by current excitation without varying the probe position with the same device, though a method or the like of performing the both measurements is conventionally known as a measuring method of measuring the electrical and optical characteristics of a material in the same fine region near the material surface and it is difficult to perform the both measurements in the same fine region. SOLUTION: This probe type light measuring device comprises a probe of which tip has light transmission property and conductivity; an optical system that has a light transmission line for guiding radiated light and light emitted by a sample, separates the light emitted by an incident system of the radiated light to the sample, a reflection system, and the sample from the light from these radiation systems, and guides the light to a photodetector; and an optical band pass filter for removing an unnecessary light wavelength component. An optical demultiplexer is inserted into a midway of the light transmission line. COPYRIGHT: (C)2006,JPO&NCIPI
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