发明名称 Substrate-to-mask alignment and securing system with temperature control for use in an automated shadow mask vacuum deposition process
摘要 The present invention is a substrate holder system for and method of providing a substrate-to-mask alignment mechanism, securing mechanism and temperature control mechanism. The substrate holder system is suitable for use in an automated shadow mask vacuum deposition process. The substrate holder system includes a system controller, and a substrate arranged between a magnetic chuck assembly and a mask holder assembly. The magnetic chuck assembly includes a magnetic chuck, a thermoelectric device, a plurality of thermal sensors and a plurality of light sources. The mask holder assembly includes a shadow mask, a mask holder, a motion control system and a plurality of cameras. The substrate holder system of the present invention provides close contact between the substrate and the shadow mask thereby avoiding the possibility of evaporant material entering into a gap therebetween.
申请公布号 US2006086321(A1) 申请公布日期 2006.04.27
申请号 US20040971218 申请日期 2004.10.22
申请人 ADVANTECH GLOBAL, LTD 发明人 BRODY THOMAS P.;MALMBERG PAUL R.;CONRAD JEFFREY W.
分类号 C23C16/00 主分类号 C23C16/00
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