发明名称 DISPLAY SYSTEM AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To adequately support analysis and evaluation of alignment result by an operator. <P>SOLUTION: At the upper part of the real waveform data in the window, the differentiated data of the real waveform data are displayed in the condition corresponding to the real waveform data. Measuring range of the waveform data as the processing object of waveform processing simulation, differentiated data of the waveform data, edge candidate position, each line mark position, relationship between each line mark position and edge candidate position, mark detecting position, error information, and template pattern or the like are displayed corresponding to the waveform data. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006114583(A) 申请公布日期 2006.04.27
申请号 JP20040298429 申请日期 2004.10.13
申请人 NIKON CORP 发明人 NAKAJIMA SHINICHI;OKITA SHINICHI;HAMASHIMA YOICHI
分类号 H01L21/027;G03F9/00 主分类号 H01L21/027
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