发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes a memory section formed at a semiconductor substrate and including a first transistor having an ONO film that can store charges between the semiconductor substrate and a memory electrode and a first STI region for isolating the first transistor, and a CMOS section formed at the semiconductor substrate and including a second transistor having a CMOS electrode and a gate dielectric and a second STI region for isolating the second transistor. The height of the top surface of the first STI region is set equal to or smaller than the height of the top surface of the second STI region.
申请公布号 US2006086971(A1) 申请公布日期 2006.04.27
申请号 US20050152114 申请日期 2005.06.15
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TAKAHASHI NOBUYOSHI;IWAMOTO SATOSHI;NORO FUMIHIKO;ARAI MASATOSHI
分类号 H01L29/792;H01L21/336 主分类号 H01L29/792
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