发明名称 Photomask blank, photomask and fabrication method thereof
摘要 A light-shieldable film is formed on one principal plane of an optically transparent substrate, and the light-shieldable film has a first light-shieldable film and a second light-shieldable film overlying the first light-shieldable film. The first light-shieldable film is a film that is not substantially etched by fluorine-based (F-based) dry etching and is primarily composed of chromium oxide, chromium nitride, chromium oxynitride or the like. The second light-shieldable film is a film that is primarily composed of a silicon-containing compound that can be etched by F-based dry etching, such as silicon oxide, silicon nitride, silicon oxynitride, silicon/transition-metal oxide, silicon/transition-metal nitride or silicon/transition-metal oxynitride.
申请公布号 US2006088774(A1) 申请公布日期 2006.04.27
申请号 US20050255135 申请日期 2005.10.21
申请人 YOSHIKAWA HIROKI;INAZUKI YUKIO;KINASE YOSHINORI;OKAZAKI SATOSHI;HARAGUCHI TAKASHI;IWAKATA MASAHIDE;FUKUSHIMA YUICHI 发明人 YOSHIKAWA HIROKI;INAZUKI YUKIO;KINASE YOSHINORI;OKAZAKI SATOSHI;HARAGUCHI TAKASHI;IWAKATA MASAHIDE;FUKUSHIMA YUICHI
分类号 C23F1/00;B32B9/00;B32B17/06;B44C1/22;C03C15/00;C03C25/68;G03F1/00 主分类号 C23F1/00
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