发明名称 COMPUTER-IMPLEMENTED METHODS AND SYSTEMS FOR CLASSIFYING DEFECTS ON A SPECIMEN
摘要 <p>Various computer-implemented methods for classifying defects on a specimen are provided. One method includes assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The method also includes displaying information about the defect groups to a user. In addition, the method includes allowing the user to assign a classification to each of the defect groups. Systems configured to classify defects on a specimen are also provided. One system includes program instructions executable on a processor for assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The system also includes a user interface configured for displaying information about the defect groups to a user and allowing the user to assign a classification to each of the defect groups.</p>
申请公布号 WO2006044426(A2) 申请公布日期 2006.04.27
申请号 WO2005US36598 申请日期 2005.10.12
申请人 KLA-TENCOR TECHNOLOGIES CORP.;TEH, CHO, HUAK;TORELLI, TOMMASO;DAVID, DOMINIC;YEUNG, CHIUMAN;SCOTT, MICHAEL, GORDON;BALASUBRAMANIAN, LALITA, A.;GAO, LISHENG;HUANG, TONG;ZHANG, JIANXIN;KOWALSKI, MICHAL;OAKLEY, JONATHAN 发明人 TEH, CHO, HUAK;TORELLI, TOMMASO;DAVID, DOMINIC;YEUNG, CHIUMAN;SCOTT, MICHAEL, GORDON;BALASUBRAMANIAN, LALITA, A.;GAO, LISHENG;HUANG, TONG;ZHANG, JIANXIN;KOWALSKI, MICHAL;OAKLEY, JONATHAN
分类号 G01N21/00;H01J3/14 主分类号 G01N21/00
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