DRAM TRANSISTOR WITH A GATE BURIED IN THE SUBSTRATE AND METHOD OF FORMING THEREOF
摘要
<p>The invention includes a transistor device (69) having a semiconductor substrate (12) with an upper surface. A pair of source/drain regions (41,59) are formed within the semiconductor substrate and a channel region (46) is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate (54) is formed within the semiconductor substrate between the pair of the source/drain regions (41,59), and can surround the channel region (46) and /or one of the source/drain regions.</p>
申请公布号
WO2006028775(A3)
申请公布日期
2006.04.27
申请号
WO2005US30668
申请日期
2005.08.29
申请人
MICRON TECHNOLOGY, INC.;SANH, TANG;HALLER, GORDON;BROWN, KRIS;EARL, ALLEN, T., III
发明人
SANH, TANG;HALLER, GORDON;BROWN, KRIS;EARL, ALLEN, T., III