发明名称 DRAM TRANSISTOR WITH A GATE BURIED IN THE SUBSTRATE AND METHOD OF FORMING THEREOF
摘要 <p>The invention includes a transistor device (69) having a semiconductor substrate (12) with an upper surface. A pair of source/drain regions (41,59) are formed within the semiconductor substrate and a channel region (46) is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate (54) is formed within the semiconductor substrate between the pair of the source/drain regions (41,59), and can surround the channel region (46) and /or one of the source/drain regions.</p>
申请公布号 WO2006028775(A3) 申请公布日期 2006.04.27
申请号 WO2005US30668 申请日期 2005.08.29
申请人 MICRON TECHNOLOGY, INC.;SANH, TANG;HALLER, GORDON;BROWN, KRIS;EARL, ALLEN, T., III 发明人 SANH, TANG;HALLER, GORDON;BROWN, KRIS;EARL, ALLEN, T., III
分类号 H01L21/8242;H01L21/336;H01L27/108;H01L29/78 主分类号 H01L21/8242
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