发明名称 |
Positive resist composition and pattern formation method using the positive resist composition |
摘要 |
A positive resist composition comprising: a resin which increases solubility in an alkali developing solution by an action of an acid and comprises a repeating unit containing a lactone structure and a cyano group and a repeating unit containing a first acid-decomposable group; a resin which increases solubility in an alkali developing solution by an action of an acid and comprises a repeating unit containing a lactone structure and a cyano group and a repeating unit containing a second acid-decomposable group which is different from the first acid-decomposable group; a compound which generates an acid upon irradiation of an actinic ray or a radiation; and a solvent.
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申请公布号 |
US7442490(B2) |
申请公布日期 |
2008.10.28 |
申请号 |
US20070723144 |
申请日期 |
2007.03.16 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
IWATO KAORU;KODAMA KUNIHIKO |
分类号 |
G03C1/76;G03C1/492;G03C1/494;G03C5/00 |
主分类号 |
G03C1/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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