发明名称 Positive resist composition and pattern formation method using the positive resist composition
摘要 A positive resist composition comprising: a resin which increases solubility in an alkali developing solution by an action of an acid and comprises a repeating unit containing a lactone structure and a cyano group and a repeating unit containing a first acid-decomposable group; a resin which increases solubility in an alkali developing solution by an action of an acid and comprises a repeating unit containing a lactone structure and a cyano group and a repeating unit containing a second acid-decomposable group which is different from the first acid-decomposable group; a compound which generates an acid upon irradiation of an actinic ray or a radiation; and a solvent.
申请公布号 US7442490(B2) 申请公布日期 2008.10.28
申请号 US20070723144 申请日期 2007.03.16
申请人 FUJIFILM CORPORATION 发明人 IWATO KAORU;KODAMA KUNIHIKO
分类号 G03C1/76;G03C1/492;G03C1/494;G03C5/00 主分类号 G03C1/76
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