| 摘要 |
A problem, which one of the inventions included in the present application solves, is to provide a semiconductor device that can simultaneously test a plurality of output pins by less channels of a semiconductor test equipment in number than the integrated output pins of the semiconductor device. Representative one of the inventions has such a configuration that an LCD driver, which is the semiconductor device having a function of driving a gate line of a liquid crystal display panel, comprises: an exclusive-OR circuit for inverting polarities of positive and negative voltages for driving the gate line; a tri-state type inverter circuit capable of changing and controlling, to a high-impedance state, an output circuit for driving the gate line; and at least one of test control terminals TEST for controlling the exclusive-OR circuit and the tri-state type inverter circuit. When a test is conducted, only one terminal of the gate output outputs a positive voltage VGH or negative voltage VGL and the other terminal is set to a high-impedance state, whereby the plurality of gate outputs are simultaneously tested.
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