发明名称 Method and apparatus for facilitating debugging of an integrated circuit
摘要 One embodiment of the present invention provides a system that facilitates debugging an integrated circuit without probing signal lines within the integrated circuit. During operation the system updates a performance counter within the integrated circuit based on the occurrence of one or more performance events. Note that some integrated circuits already include a performance counter which is used to measure the performance of the integrated circuit. Next, the system triggers a debugging operation based on the content of the performance counter, thereby facilitating debugging of the integrated circuit without probing signal lines within the integrated circuit. By using the performance counter to trigger the debugging operation in addition to measuring performance, the present invention can substantially reduce the amount of additional circuitry required to facilitate debugging of the integrated circuit.
申请公布号 US7444549(B1) 申请公布日期 2008.10.28
申请号 US20050033616 申请日期 2005.01.11
申请人 SUN MICROSYSTEMS, INC. 发明人 CHANG SI-EN
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址