发明名称 Method for manufacturing semiconductor device
摘要 A technique is provided for forming a crystalline semiconductor film whose orientation is uniform by control of crystal orientation and obtaining a crystalline semiconductor film in which concentration of an impurity is reduced. A configuration of the invention is that a first semiconductor region is formed on a substrate having transparent characteristics of a visible light region, a barrier film is formed over the first semiconductor region, a heat retaining film covering a top and side surfaces of the first semiconductor region is formed over the barrier film, the first semiconductor region is crystallized by scanning a continuous wave laser beam from one edge of the first semiconductor region to the other through the substrate, then the heat retaining film and the barrier film are removed and a second semiconductor region is formed as an active layer of TFT by etching the crystallized first semiconductor region. A pattern of the second semiconductor region formed by etching is formed in a manner that a scanning direction of the laser beam and a channel length direction of the TFT are arranged in almost the same direction in order to smooth drift of carriers.
申请公布号 KR100865460(B1) 申请公布日期 2008.10.28
申请号 KR20020051908 申请日期 2002.08.30
申请人 发明人
分类号 G02F1/13;H01L21/20;H01L21/268;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 G02F1/13
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