| 摘要 |
A sorting handler for burn-in test is provided to increase a UPH(Unit Per Hour) by reducing a rack changing time. A rack(2) is arranged at one side of a main body(1). A plurality of burn-in boards are loaded into the rack. A loading unit(3) is arranged at the other side of the main body. A tray for storing semiconductor packages to be tested is loaded into the loading unit. An unloading unit(4) is arranged at one side of the loading unit. A tray for storing the tested semiconductor packages is loaded into the unloading unit. A burn-in board movable unit moves the burn-in board from the rack to a desired arbitrary position. A DC test socket(5) is connected to the semiconductor package to be tested in order to perform an electrical performance test. A buffer unit(6) stores temporarily the tested semiconductor package. A first and second guide frames(71,72) are extended in an X-axis direction on the main body. A first and second loading pickers(81,82) are installed and moved in X-Y axis directions on the first guide frame in order to transfer the semiconductor package from the loading unit to a DC test unit and from the DC test unit to the burn-in board. A first and second unloading pickers(91,92) are installed and moved in the X-Y axis directions on the second guide frame in order to transfer the burn-in board to the buffer unit and from the buffer unit to the unloading unit. |
