| 摘要 |
PROBLEM TO BE SOLVED: To provide microscopy and a microscope capable of observing desired information of samples with an extremely high S/N ratio in a short time without having to raise the intensity of a light source. SOLUTION: The microscopy and the microscope include both a simultaneous irradiation step for irradiating a sample with first electromagnetic waves and second electromagnetic waves having different frequencies in such a way that at least parts of them may overlap each other and a simultaneous irradiation visualization step for visualizing a spatial distribution of refractive index changes, which occur due to the irradiation of the first electromagnetic waves within an irradiated region of the sample irradiated with the first electromagnetic waves and the second electromagnetic waves overlapping each other in the simultaneous irradiation step, as a phase difference image of the second electromagnetic waves transmitted through the sample. COPYRIGHT: (C)2008,JPO&INPIT
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