| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit in which a test time can be reduced, thereby, a test cost can be reduced. SOLUTION: An address generating circuit 105 generates a test address 107 synchronizing with an external clock 115, and supplies this to a ROM 101 as a ROM address 104. A MISR 112 compresses output ROM data 106 output from the ROM 101 corresponding to input ROM address 104. A 4 bits shift register 114 outputs compressed data (MISR output 113), outputting all collected 4 data. COPYRIGHT: (C)2008,JPO&INPIT
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