发明名称 RIDGELINE MEASURING METHOD AND DIEHEAD
摘要 PROBLEM TO BE SOLVED: To measure accurately the position of a ridgeline (edge), when a measuring object has a surface of a light reflecting material (for example, a metal material). SOLUTION: A ridgeline measuring method has a light absorbing coating formation process for forming a coating of a light absorbing material on the surface on one side wherein a ridgeline of the measuring object is used as a boundary, a ridgeline position measuring process for measuring optically the ridgeline position which is the position of the ridgeline of the measuring object on which the coating of the light absorbing material is formed, and an opening interval operation process for operating an interval between two ridgelines from two ridgeline positions. A diehead as the measuring object to which the ridgeline measuring method is applied is also provided. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008157857(A) 申请公布日期 2008.07.10
申请号 JP20060349360 申请日期 2006.12.26
申请人 DAINIPPON PRINTING CO LTD 发明人 NISHIKAWA HIROSHI;AOKI TAKASHI
分类号 G01B11/00 主分类号 G01B11/00
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