| 摘要 |
PROBLEM TO BE SOLVED: To provide a signal selection circuit and a semiconductor testing device capable of speed heightening of signal switching, cost reduction and miniaturization, by shortening greatly a settling time of a low-pass filter, and by reducing the number of A/D conversion parts. SOLUTION: A representative configuration of the signal selection circuit is characterized by including a plurality of analog signal input parts 152; a plurality of low-pass filters 154 connected respectively to the plurality of analog signal input parts 152; and a multiplexer 156 connected to the plurality of low-pass filters 154, for selecting a signal alternatively. COPYRIGHT: (C)2008,JPO&INPIT
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