发明名称 |
Method of etching a metal oxide layer |
摘要 |
A method of etching a metal oxide layer formed on a metal layer is provided. The method includes mounting a specimen having the metal oxide layer and a photoresist on the metal oxide layer in a reaction chamber, wherein the metal oxide layer is formed on the metal layer and a pattern is formed on the photoresist. Primary etching of the metal oxide layer exposed by the photoresist may be performed using Cl<SUB>2 </SUB>gas in an inductively coupled plasma method. Secondary etching of residues remaining on an etched region of the metal oxide layer may be performed using BCl<SUB>3 </SUB>gas in the inductively coupled plasma method.
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申请公布号 |
US2008164238(A1) |
申请公布日期 |
2008.07.10 |
申请号 |
US20070987738 |
申请日期 |
2007.12.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHUNG SEOK-JAE;HWANG SOON-WON;LEE JUNG-HYUN;KIM YEON-HEE |
分类号 |
B44C1/22 |
主分类号 |
B44C1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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