发明名称 Method of etching a metal oxide layer
摘要 A method of etching a metal oxide layer formed on a metal layer is provided. The method includes mounting a specimen having the metal oxide layer and a photoresist on the metal oxide layer in a reaction chamber, wherein the metal oxide layer is formed on the metal layer and a pattern is formed on the photoresist. Primary etching of the metal oxide layer exposed by the photoresist may be performed using Cl<SUB>2 </SUB>gas in an inductively coupled plasma method. Secondary etching of residues remaining on an etched region of the metal oxide layer may be performed using BCl<SUB>3 </SUB>gas in the inductively coupled plasma method.
申请公布号 US2008164238(A1) 申请公布日期 2008.07.10
申请号 US20070987738 申请日期 2007.12.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG SEOK-JAE;HWANG SOON-WON;LEE JUNG-HYUN;KIM YEON-HEE
分类号 B44C1/22 主分类号 B44C1/22
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