发明名称 SAMPLE INTRODUCING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a sample introducing device for introducing a sample capable of carrying out elementary analysis with high sensitivity, by an element analyzer such as an ICP mass spectrometer and an ICP emission spectrophotometer. SOLUTION: An infrared irradiation device 5 for emitting an infrared ray to an atomizing port of a nebulizer 2 to heat the sample is provided in this sample introducing device of the present invention constituted to atomize the sample fog-likely into a cyclone chamber 1 by the nebulizer 2, and to introduce the sample from a feed port 11 of the cyclone chamber 1 into a plasm torch or the like of the element analyzer. A gas supply pipe 41 for supplying a carrier gas to the nebulizer 2 is heated by a heating part 42, and a cooling part 46 cools a feed pipe 12 and an introducing pipe 46 communicated with the feed port 11 of the cyclone chamber 1. A particle size of the sample atomized by the nebulizer 2 is reduced by this manner, and only the sample of reduced particle size is introduced into the plasma torch. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008157895(A) 申请公布日期 2008.07.10
申请号 JP20060350324 申请日期 2006.12.26
申请人 HORIBA LTD 发明人 UCHIHARA HIROSHI;KATO TAKAO;TAKAGI IKUE
分类号 G01N21/73;G01N27/62 主分类号 G01N21/73
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