发明名称 SAMPLE INSPECTION DEVICE AND SAMPLE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To restrain a current from leaking to a sample and a probe to measure highly sensitively electric characteristics, when heating the sample by a heater. SOLUTION: A sample heating part for heating the sample 2 is constituted of the heater 23, a metal shield 22 for covering the heater under an electrically insulated condition to be grounded, and an insulating sheet 21 provided in a sample mounting side of the metal shield. A probe heating part is constituted similarly of a heater 23, a metal shield 27 for covering the heater under an electrically insulated condition to be grounded, and an insulating sheet 26. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008157650(A) 申请公布日期 2008.07.10
申请号 JP20060343877 申请日期 2006.12.21
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SUZUKI HIROYUKI;SASAJIMA MASAHIRO
分类号 G01R31/302;G01R31/26 主分类号 G01R31/302
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