发明名称 METHOD FOR FORMING INSULATING FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A method for forming an insulating film includes a step of preparing a substrate, which is to be processed and has silicon exposed on the surface; a step of performing oxidizing to the silicon on the surface, and forming a silicon oxide thin film on the surface of the silicon; a step of performing first nitriding to the silicon oxide film and the base silicon thereof, and forming a silicon oxynitride film; and a step of performing first heat treatment to the silicon oxynitride film in N&lt;SUB&gt;2&lt;/SUB&gt;O atmosphere. In such method, a step of performing second nitriding to the silicon oxynitride film may be further included after the first heat treatment, and furthermore, a step of performing second heat treatment to the silicon oxynitride film after the second nitriding may be included.</p>
申请公布号 WO2008081724(A1) 申请公布日期 2008.07.10
申请号 WO2007JP74483 申请日期 2007.12.20
申请人 TOKYO ELECTRON LIMITED;HONDA, MINORU;SATO, YOSHIHIRO;NAKANISHI, TOSHIO 发明人 HONDA, MINORU;SATO, YOSHIHIRO;NAKANISHI, TOSHIO
分类号 H01L21/318;H01L29/78 主分类号 H01L21/318
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