发明名称 SHALLOW TRENCH ISOLATION PROCESS UTILIZING DIFFERENTIAL LINERS
摘要 A method of manufacturing an integrated circuit (IC) can utilize a shallow trench isolation (STI) technique. The shallow trench isolation technique can be used in an IC process. Separate liners for the trench are used for NMOS and PMOS regions. The liners can induce strain in the substrate.
申请公布号 US2008164561(A1) 申请公布日期 2008.07.10
申请号 US20080047636 申请日期 2008.03.13
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KRISHNAN SRINATH
分类号 H01L27/12 主分类号 H01L27/12
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