| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing apparatus for efficiently adjusting the voltage values outputted from power supply sections. SOLUTION: The semiconductor tester 100 implements a process for detecting the voltage values supplied from the power supply sections 11, 12, ..., to a card. A control section 40 respectively compares the detected voltage values with optimal voltage values for power supply circuits 11a, 12a, ..., and determines whether the voltage values correspond to the optimal voltage values. If there are power supply sections whose voltage values do not correspond to the optical voltage values among the power supply sections 11, 12, ..., a control signal and optimal voltage value data are outputted to voltage adjustment sections in the power supply sections, and a process for adjusting the voltage values is implemented. COPYRIGHT: (C)2008,JPO&INPIT
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