| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor storage device capable of performing normal detection even when adjacent word lines are short-circuited on a test mode and also capable of performing detection at a burst length unit and relieving an abnormality when it exists in the detection. SOLUTION: A memory bank of the semiconductor storage device includes: a selection means successively selecting and outputting data which are output from a plurality of memory units, in accordance with a selection signal input from the outside; a successive comparison means for successively comparing the data successively output by the successive comparison means and reference data input from the outside, and outputting the comparison result as normal when the result of comparison is in coincidence and outputting as abnormal when the result of comparison is not in coincidence; and a condensed result storage means for storing the condensed result of the memory bank, which makes the comparison results successively output by the successive comparison means as normal when these results are all normal, and makes the comparison results as abnormal when at least one of them is not in coincidence. COPYRIGHT: (C)2008,JPO&INPIT
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