| 摘要 |
A lamp failure detector is provided to detect lamp failure for an array of lamps used to produce radiation for a thermal processing. A lamp failure detector includes a data acquisition(DAQ) module(108) and a controller(110). The DAQ module samples voltage signals at different sampling positions along a circuit path formed by a group of serially connected lamps in an array. The controller detects a failure in at least one lamp based on voltage drops across at least two lamps, and determined by the sampled voltage signals. The group of serially connected lamps includes more than two lamps. The controller detects an open circuit condition of a first lamp based on a zero voltage drop across a second lamp.
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