发明名称 MEASURING METHOD FOR REFLECTIVITY CURVE OF X RAY AND OF NEUTRON RADIATION AND MEASURING INSTRUMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To sharply shorten measurement time for a reflectivity curve of X rays or of neutron radiations and to trace in real time the state of the physical properties, etc. varying with time owing to external stimuli. <P>SOLUTION: White X rays or neutron radiations are input into a transmissive polychromator 1 from its backside to converge them into a fan shape and then caused to diverge, thereby preparing an X-ray beam or a neutron radiation beam with the wavelength of the X rays or neutron radiations continuously varying in a range extending from its lower limit to three to ten times the lower limit dependently on their traveling direction. With a specimen S disposed at a convergent point of the X-ray beam or neutron radiation beam, the X-ray beam or neutron radiation beam is applied to a specimen surface at a certain application angle. The intensity distribution of reflected X rays or of neutron radiations reflected by the surface of the specimen is measured by a one-dimensional detector 2, finding the reflectivity curve of the X rays or neutron radiations varying as a function of a scattering vector in a direction vertical to the specimen surface from one-dimensional intensity distribution thus obtained. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008170236(A) 申请公布日期 2008.07.24
申请号 JP20070002813 申请日期 2007.01.10
申请人 HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION 发明人 MATSUSHITA TADASHI
分类号 G01N23/201;G01N23/202 主分类号 G01N23/201
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