发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a ferroelectric capacitor with excellent and uniform polarization inversion characteristics without raising production cost, and also to provide a manufacturing method therefor. SOLUTION: A ferroelectric film (PZT film) 127 that constitutes a ferroelectric capacitor 130 is formed by a sputtering method, and it is subsequently subjected to thermal processing (RTA) in an oxygen atmosphere. At this time, the amount of oxygen to be supplied into the atmosphere is adjusted according to cumulative time spent for a target during the formation of the ferroelectric film 127. For example, when thermally processing the ferroelectric film 127 that is formed in an early period of lifetime of the target, oxygen supply shall be 40 to 60 sccm, and when thermally processing the ferroelectric film that is formed in a later period of the lifetime, the oxygen supply shall be 70 to 100 sccm. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008205235(A) 申请公布日期 2008.09.04
申请号 JP20070040321 申请日期 2007.02.21
申请人 FUJITSU LTD 发明人 TAKAHASHI MAKOTO;FUJIKI MITSUSHI;SUEZAWA KENKICHI;O FUMIO;NAKAMURA WATARU
分类号 H01L21/8246;H01L27/105 主分类号 H01L21/8246
代理机构 代理人
主权项
地址