发明名称 SPECIMEN MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a specimen measuring apparatus capable of facilitating the grasping of a maintenance work schedule of a specimen analyzing device. SOLUTION: The specimen measuring apparatus (an immunoassay device 1) is provided with a measuring part (a measuring device 2) for measuring specimens, a storage part (a hard disk) for storing maintenance schedules, a display part 4b, and a display control part (a control part 4a) for displaying a display screen in a calendar form on the display part 4b to be displayed in relation to a date and maintenance items scheduled to execute on the date. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008292159(A) 申请公布日期 2008.12.04
申请号 JP20070123999 申请日期 2007.05.08
申请人 SYSMEX CORP 发明人 TAKEHARA HISATO;WAKAMIYA YUJI;OKUZAKI TOMOHIRO
分类号 G01N35/00 主分类号 G01N35/00
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