发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH DUAL METAL GATE |
摘要 |
<p>A manufacturing method of the semiconductor device having dual metal-gate is provided to form the metal gate having the different work function using the surface energy state difference of substrate. A manufacturing method of the semiconductor device having the dual metal-gate comprises the following steps: the step for forming the gate insulating layer(23) on the substrate(21); the step for forming the first metal layer(25) in the first area on the gate insulating layer; the step for forming second metal layer on the overall structure including first metal layer; the step for planarizing the second metal layer so that it become the same thickness as the first metal layer and leaving behind in the second part; the step for forming the insulating layer on the first and the second metal layer of the first and the second area; the step for patterning the insulating layer and the first and the second metal layer.</p> |
申请公布号 |
KR20080109218(A) |
申请公布日期 |
2008.12.17 |
申请号 |
KR20070057276 |
申请日期 |
2007.06.12 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, HEUNG JAE;YANG, HONG SEON;LIM, KWAN YONG;SUNG, MIN GYU |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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