发明名称 |
Technique for diagnosing and screening optical interconnect light sources |
摘要 |
A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.
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申请公布号 |
US7466404(B1) |
申请公布日期 |
2008.12.16 |
申请号 |
US20050145388 |
申请日期 |
2005.06.03 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
VACAR DAN;MCELFRESH DAVID K.;LOPEZ LEONCIO D.;MELANSON ROBERT |
分类号 |
G01N21/00 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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