发明名称 High withstand voltage trenched MOS transistor and manufacturing method thereof
摘要 A high withstand voltage transistor includes: a gate electrode provided in a trench formed on a semiconductor substrate; a source and a drain which are respectively formed on a side of the gate electrode and another side of the gate electrode, and which are a predetermined distance away from the gate electrode; first electric field relaxation layers one of which is formed on a wall of the trench on the side of the source and another one of which is formed on a wall of the trench on the side of the drain; and second electric field relaxation layers one of which is formed between the source and the gate electrode, and another one of which is formed between the drain and the gate electrode.
申请公布号 US7465989(B2) 申请公布日期 2008.12.16
申请号 US20070902583 申请日期 2007.09.24
申请人 SHARP KABUSHIKI KAISHA 发明人 HAYASHI KEIJI
分类号 H01L27/108 主分类号 H01L27/108
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