| 摘要 |
An integrated circuit includes an AD converter and a self-test circuit configured to test the AD converter. The self-test circuit includes a clock generator which generates a clock for allowing the AD converter to AD-convert an external sine wave signal externally input, a sine wave generator which generates an internal sine wave signal in digital form, a subtractor which determines a differential signal between the AD-converted external sine wave signal and the internal sine wave signal, a PLL device which allows a phase-locked loop receiving the differential signal as an input to control a phase of the internal sine wave signal such that the internal sine wave signal is in phase with the external sine wave signal, and a root mean square calculator which calculates a root mean square of the differential signal to generate a diagnostic signal corresponding to the AD converter.
|
