发明名称 Manufacturing method of semiconductor device
摘要 To provide a semiconductor device including a thinned substrate with high yield. After forming a protective layer in a predetermined portion (at least a portion covering a side surface of a substrate) of the substrate, grinding and polishing of the substrate are performed. In other words, an element layer including a plurality of integrated circuits is formed over one surface of the substrate, the protective layer is formed in contact with at least the side surface of the substrate, and the substrate is thinned (for example, the other surface of the substrate is ground and polished), the protective layer is removed, and the polished substrate and the element layer is divided so as to form stack bodies including a layer provided with at least one of the plurality of integrated circuits.
申请公布号 US7465596(B2) 申请公布日期 2008.12.16
申请号 US20060454851 申请日期 2006.06.19
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TSURUME TAKUYA;KUSUMOTO NAOTO
分类号 H01L21/00 主分类号 H01L21/00
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