发明名称 CMP conditioner, method for arranging hard abrasive grains for use in CMP conditioner, and process for producing CMP conditioner
摘要 Disclosed are CMP conditioners which can suppress microscratching of the surface of a semiconductor substrate and can realize stable CMP conditioner properties. The CMP conditioner according to the first aspect of the present invention comprises a support member and a plurality of hard abrasive grains provided on a surface of the support member, wherein the plurality of hard abrasive grains are regularly arranged on the surface of the support member. The CMP conditioner according to the second aspect of the present invention comprises a support member and a plurality of hard abrasive grains provided on the surface of the support member, wherein the plurality of hard abrasive grains are arranged on the surface of the support member regularly and so as for the density of the hard abrasive grains to decrease from the inner side of the support member toward the outer side of the support member.
申请公布号 US7465217(B2) 申请公布日期 2008.12.16
申请号 US20060385297 申请日期 2006.03.20
申请人 NIPPON STEEL CORPORATION 发明人 KINOSHITA TOSHIYA;HASHINO EIJI;SATO SETSUO;ARAKI RYUICHI
分类号 B24B1/00;B24B37/04;B24B53/017;B24B53/12;B24D3/06;B24D3/14;B24D7/14;B24D18/00 主分类号 B24B1/00
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