发明名称 DICING DIE BOND FILM COMPRISING A MEASURING UNIT FOR THICKNESS AND METHOD OF PREPARING THE SAME
摘要 The dicing die bond film is provided to improve the yield by measuring the thickness without the direct impact being given to the product. The dicing die bond film(100) comprises the support base layer(130), the adhesion layer, the glue layer(120), one or more measuring units(150a, 150b, 150c, 150d). The measuring unit measures the thickness of the total layer of the dicing die bond film. The manufacturing method of the dicing die bond film comprises as follows. A step is for forming the adhesion layer on the support base the glue layer on the protective film. The first cutting stage is for removing the section except the region for adhering the wafer and thickness measurement region to the glue layer with a cutter. A step is for adhering the glue layer on the adhesion layer on the support base and protective film. The second cutting stage is for removing the section except the region for adhering the wafer and thickness measurement region to the support base and adhesion layer.
申请公布号 KR100874566(B1) 申请公布日期 2008.12.16
申请号 KR20070073951 申请日期 2007.07.24
申请人 CHEIL INDUSTRIES INC. 发明人 OH, GWI JEONG;KIM, CHEOL YOUNG
分类号 H01L21/301;H01L21/60 主分类号 H01L21/301
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