发明名称 Lithographic apparatus and device manufacturing method using a compensation scheme for a patterning array
摘要 A lithographic apparatus comprising an array of individually controllable elements that modulates a beam of radiation and a projection system that projects the modulated beam onto the substrate. The individually controllable elements are provided with a compensation feature that is arranged to provide compensation radiation that substantially or at least partially cancels out unwanted radiation, such that the unwanted radiation is not projected by the projection system onto the substrate.
申请公布号 US7466394(B2) 申请公布日期 2008.12.16
申请号 US20050312638 申请日期 2005.12.21
申请人 ASML NETHERLANDS B.V. 发明人 TROOST KARS ZEGER;BASELMANS JOHANNES JACOBUS MATHEUS
分类号 G03B27/54 主分类号 G03B27/54
代理机构 代理人
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