| 摘要 |
An input buffer circuit of semiconductor memory apparatus is provided to control response characteristics conveniently and rapidly by using a test signal without mask revision. In an input buffer circuit of semiconductor memory apparatus, a buffer control unit(100) makes a plurality of enable signals in response to the test signal and reset signal active. The amount of sinker current is varied according to a plurality of enable signals which are a combination signal composed of a first and second enable signal, and a buffer unit(200) in which the output level is determined. |
