发明名称 Image transfer process for thin film component definition
摘要 A method for fabricating a thin film component according to one embodiment comprises forming a wafer having a thin film layer, a release layer, and a patterned layer of photoresist; transferring the pattern of the layer of photoresist to the release layer and the thin film layer; adding a layer of metal to the wafer; heating the wafer to a predetermined temperature for a period of time sufficient to cause deformation of the photoresist to an extent that the photoresist creates cracks in the metal layer; applying a solvent to dissolve at least a portion of the release layer, the solvent penetrating the cracks in the metal layer to reach the release layer; and removing the release layer and any portions of the layers above the release layer.
申请公布号 US7465532(B2) 申请公布日期 2008.12.16
申请号 US20070870364 申请日期 2007.10.10
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 CORNWELL DWIGHT;WERNER DOUGLAS JOHNSON
分类号 G03F7/20;G03F7/00;G11B5/127;G11B5/31 主分类号 G03F7/20
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