PHASE MEASURING DEVICE, SKEW MEASURING DEVICE, PHASE MEASURING METHOD, AND SKEW MEASURING METHOD

摘要

Provided is a phase measuring device for measuring a phase of a signal-to-be-measured. The device includes: a sampling unit which samples a signal-to-be-measured at a timing of a given sampling clock; a jitter application unit which applies a jitter to at least one of the signal-to-be-measured inputted to the sampling unit and the sampling clock; a phase calculation unit which calculates a phase of the signal-to-be-measured according to the sampling result in the sampling unit. The jitter application unit applies such a jitter that distribution of a jitter component for delaying an edge phase of the signal-to-be-measured or the sampling clock is substantially symmetrical to distribution of a jitter component for advancing the edge phase.