发明名称 |
PHOTO-SENSITIVE COMPOUND AND PHOTORESIST COMPOSITION INCLUDING THE SAME |
摘要 |
<p>A photosensitive compound, a photoresist composition containing the compound, and a method for preparing a photoresist pattern by using the composition are provided to improve the uniformity of coating and resolution, to reduce the line edge roughness of pattern and to enhance development and dry etching resistance. A photosensitive compound is represented by the formula 1, wherein x is an integer of 1-5; y is an integer of 2-6; and R is a C2-C20 hydrocarbon group. A photoresist composition comprises 1-85 wt% of the compound of the formula 1; 1-55 wt% of a compound which reacts the OH group of the compound of the formula 1 to bind with the photosensitive compound of the formula 1; 1-15 wt% of a photoacid generator; and 12-97 wt% of an organic solvent.</p> |
申请公布号 |
KR20080107871(A) |
申请公布日期 |
2008.12.11 |
申请号 |
KR20070056203 |
申请日期 |
2007.06.08 |
申请人 |
DONGJIN SEMICHEM CO., LTD. |
发明人 |
LEE, JAE WOO;LEE, JUNG YOUL;KIM, JEONG SIK;JANG, EU JEAN;KIM, JAE HYUN |
分类号 |
G03F7/004;G03F7/008;G03F7/016 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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