发明名称 DEVICE FOR MEASURING SPECTRAL SENSITIVITY CHARACTERISTICS OF SOLAR CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a device for measuring spectral sensitivity characteristics of a solar cell that removes a noise component due to time variation of white bias light without processing averaging for a long time, thereby improving an SN ratio. <P>SOLUTION: The device has a white bias light effect with respect to the spectral sensitivity characteristics. The device includes the solar cell 1 to be measured, monochrome light radiation means 2, 3 for radiating monochrome lightΦ(λ) to the solar cell 1, a compensation solar cell 4 having a spectral sensitivity, an electrical responsiveness and an optical responsiveness roughly equal to those of the solar cell 1, white bias light radiation means 5, 6 for radiating white bias light to the solar cell 1 and the compensation solar cell 4 concurrently from an identical white bias light source, and a detector 7 for detecting a differential signal between a detection signal detected from the solar cell 1 and a detection signal detected from compensation solar cell 4. The spectral sensitivity measurement device measures the spectral sensitivity characteristic of the solar cell 1 under the irradiation with the white bias light. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008298471(A) 申请公布日期 2008.12.11
申请号 JP20070142289 申请日期 2007.05.29
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 IGARI SHINICHI
分类号 G01M11/00;G01J3/10;H01L31/04 主分类号 G01M11/00
代理机构 代理人
主权项
地址