发明名称 Lithographic Apparatus and Device Manufacturing Method
摘要 A lithographic apparatus includes a support structure configured to hold a patterning device, the patterning device configured to pattern a beam of radiation according to a desired pattern, a substrate table configured to hold a substrate and a projection system configured to project the beam as patterned onto a target portion of the substrate. The lithographic apparatus further includes a polarization modifier disposed in a path of the beam. The polarization modifier comprises a material having a linear polarization.
申请公布号 US2008304037(A1) 申请公布日期 2008.12.11
申请号 US20080192676 申请日期 2008.08.15
申请人 ASML NETHERLANDS B.V. 发明人 TOTZECK MICHAEL;GEH BERND PETER;MILLER SKIP
分类号 G03B27/72 主分类号 G03B27/72
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