发明名称 PUSHING UNIT, TEST HANDLER HAVING THE SAME, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要 A pushing unit and test handler having the same is provided to allow loading many semiconductor devices since a multi-carry set and a support bar supporting the multi-carry set. A pushing unit(740) and test handler includes a match plate(750) and a plurality of supporting plates(760) connected to the match plate, and a contact socket set(772), combined in a plurality of supporting plates, composed of a plurality of unit contact sockets(770). The support plate and the match plate are jointed with a pin and an elastic member is installed between the support plate and the match plate.
申请公布号 KR20080107523(A) 申请公布日期 2008.12.11
申请号 KR20070055385 申请日期 2007.06.07
申请人 MIRAE CORPORATION 发明人 LEE, EUNG YONG;PARK, MU KYUN;GU, WAN CHUN
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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