发明名称 AMORPHOUS OXIDE, AND FIELD EFFECT TRANSISTOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a field effect transistor which is excellent in transistor characteristics such as field effect mobility and S value and excellent in environmental stability, and also a field effect transistor which has less varying transistor characteristics resulting from the atomic composition ratio of a constituent atom and has a large margin (design flexibility) of the atomic composition ratio. <P>SOLUTION: In the field effect transistor, an active layer in the transistor is made of an amorphous oxide containing In, Zn, N and O, an atomic composition ratio of the N to the N and O in the amorphous oxide is not smaller than 0.01 at.% and not larger than 3 at.%, and Ga is not contained in the oxide. When Ga is contained in the oxide, the number of Ga atoms is set to be smaller than the number of N atoms. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008300518(A) 申请公布日期 2008.12.11
申请号 JP20070143431 申请日期 2007.05.30
申请人 CANON INC 发明人 ITAGAKI NAHO;IWASAKI TATSUYA
分类号 H01L29/786 主分类号 H01L29/786
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