发明名称 CMOS IMAGE SENSOR, AND PIXEL THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a CMOS image sensor using a practical pin photodiode and a charge transfer transistor, and to provide a gate structure of the charge transfer transistor having high charge transfer efficiency, excellent blooming control and low dark current. <P>SOLUTION: The pixel of the image sensor includes a gate insulation film formed on a substrate doped with an impurity of a first conductivity type, a transfer gate formed on the gate insulation film, a photodiode formed inside one substrate of the transfer gate, and a floating diffusion node formed inside the other substrate of the transfer gate. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008300844(A) 申请公布日期 2008.12.11
申请号 JP20080143129 申请日期 2008.05.30
申请人 MAGNACHIP SEMICONDUCTOR LTD 发明人 JAROSOLAV HYNECEK;HAN HYUNG-JUN
分类号 H01L27/146;H04N5/335;H04N5/359;H04N5/361;H04N5/369;H04N5/372;H04N5/374 主分类号 H01L27/146
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