发明名称 PROBE FOR INSPECTION OF EDGES OF A STRUCTURE
摘要 An apparatus including a linear array transducer coupled to an upper housing of the apparatus and positioned above a tapered chamber. The tapered chamber configured to maintain a column of couplant between the linear array transducer and a structure to be inspected as the linear array transducer is positioned over an edge of the structure.
申请公布号 WO2008106535(A3) 申请公布日期 2008.12.11
申请号 WO2008US55164 申请日期 2008.02.27
申请人 THE BOEING COMPANY;YOUNG, FRED, D. 发明人 YOUNG, FRED, D.
分类号 G01N29/28;G01N29/22;G01N29/265 主分类号 G01N29/28
代理机构 代理人
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