发明名称 IMAGE DEFECT INSPECTION METHOD, IMAGE DEFECT INSPECTION APPARATUS, AND APPEARANCE INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an image defect inspection method and an image defect inspection apparatus reduced in errors caused by deviation of two image distributions to be compared. SOLUTION: This image defect inspection apparatus includes: a difference image detection part 6 for detecting a gray level difference of corresponding parts of two images; and a defect detection part 8 for comparing the detected gray level difference with a threshold value, and determining a defect when the gray level is larger than the threshold value. The difference image detection part includes: an average calculation part 11 for detecting gray level differences with positive and negative signs to calculate an average value of the gray level differences with the signs; a correction part 12 for calculating a corrected gray level difference with a sign by correcting the gray level differences with the signs by the calculated average value; and an absolute value conversion part 13 for calculating an absolute value corrected gray level difference without a sign from the corrected gray level difference with the sign. The defect detection part 8 compares the absolute value corrected gray level difference with a threshold value. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008298788(A) 申请公布日期 2008.12.11
申请号 JP20080175786 申请日期 2008.07.04
申请人 TOKYO SEIMITSU CO LTD 发明人 ISHIKAWA AKIO
分类号 G01N21/88;G01N21/956;G06T1/00;G06T7/00;H01L21/66 主分类号 G01N21/88
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